- All sections
- G - Physics
- G01Q - Scanning-probe techniques or apparatus; applications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
- G01Q 60/32 - AC mode
Patent holdings for IPC class G01Q 60/32
Total number of patents in this class: 157
10-year publication summary
6
|
16
|
14
|
21
|
12
|
13
|
10
|
6
|
6
|
3
|
2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
Owner |
All patents
|
This class
|
---|---|---|
Nederlandse Organisatie voor Toegepast-natuurwetenschappelijk Onderzoek TNO | 2362 |
30 |
Bruker Nano, Inc. | 334 |
15 |
Oxford Instruments Asylum Research, Inc. | 34 |
10 |
National University Corporation Kanazawa University | 243 |
8 |
Nearfield Instruments B.V. | 34 |
7 |
Olympus Corporation | 13667 |
6 |
Centre National de La Recherche Scientifique | 9632 |
5 |
Osaka University | 3143 |
4 |
Oxford Instruments plc | 20 |
4 |
Specs Zürich GmbH | 5 |
3 |
UT-Battelle, LLC | 1333 |
3 |
Ohba, Yusuke | 9 |
3 |
Shimadzu Corporation | 5791 |
2 |
National Institute of Advanced Industrial Science and Technology | 3677 |
2 |
Japan Science and Technology Agency | 1564 |
2 |
Anasys Instruments | 6 |
2 |
Consejo Superior de Investigaciones Cientificas | 932 |
2 |
Ecole Polytechnique Federale de Lausanne (epfl) | 1434 |
2 |
Korea Research Institute of Standards and Science | 639 |
2 |
Universidad Autonoma de Madrid | 200 |
2 |
Other owners | 43 |